Stay ConnectedUnderstanding Semiconductors: Modern Metrology from Lab to Fab, is a podcast for engineering leaders in characterization, metrology, process, and analytics, looking for discussion around semiconductor metrology challenges. Each episode will feature a conversation with technology experts about problems facing the semiconductor metrology industry.
Welcome to Understanding Semiconductors!
Copyright: © Copyright Dan Sanchez
Ever wondered how atom probe tomography advances our understanding of semiconductors and improves device performance?
In today's episode, we dive deep into the world of semiconductors as we explore the fascinating realm of atom probe tomography. Our guest expert, David Larson, sheds light on the intricacies of this powerful materials characterization technique. From minimizing damage and improving yield to overcoming challenges in data reconstruction, David shares insights on the latest advancements and future possibilities in the field. Tune in to gain a deeper understanding of semiconductors and atom probe technology's role in their analysis.
Join us as we discuss the following:
Here is part two of Markus’ conversation with Suman Datta. This episode is a thorough examination of his current research and how metrology envisions the Path Beyond CMOS:
What’s going to change in the transistor structure in the future?
The importance of power delivery
How to utilize the front and backside for vertical scaling?
Using a representative stack and metrology and correlating it to real-world performance
What’s the penalty from the bonding approach?
The importance of reliability is a function of not only the material, but also the use case
Suman is the Joseph M Pettit Chair of Advanced Computing and Georgia Research Alliance (GRA), an Eminent Scholar, and a Professor in the School of Electrical & Computer Engineering at Georgia Tech. His research group focuses on semiconductor devices that enable new computing models such as in-memory computing, brain-inspired computing, cryogenic computing, resilient computing, etc. (source)
Reach out to Markus for any potential guest requests or episode ideas here: https://www.linkedin.com/in/markus-kuhn-4b502110/
For the latest in new Metrology Techniques and Solutions check out https://rsmd.rigaku.com/
To make sure you never miss an episode of Understanding Semiconductors, subscribe on Apple Podcasts, Spotify, and the website.
Listening on a desktop & can’t see the links? Just search for Understanding Semiconductors in your favorite podcast player.
This episode is one of two parts. Stay tuned for part two coming soon!
Suman Datta is the Joseph M Pettit Chair of Advanced Computing and Georgia Research Alliance (GRA), an Eminent Scholar and Professor in the School of Electrical & Computer Engineering at Georgia Tech. His research group focuses on semiconductor devices that enable new computing models such as in-memory computing, brain-inspired computing, cryogenic computing, resilient computing, etc. " (source)
This episode covers -
Suman’s Career Journey
Today’s Talent Pipeline in the Semiconductor IndustryHow to attract the best and brightest into electrical engineering?
What is the Next Big Thing in the Semiconductor Industry?The Increasing Importance of Chip Security
Advanced Bonding Techniques and Packaging Solutions creating more complex and groundbreaking chips
Reach out to Markus for any potential guest requests or episode ideas here: https://www.linkedin.com/in/markus-kuhn-4b502110/
For the latest in new Metrology Techniques and Solutions check out https://rsmd.rigaku.com/
To make sure you never miss an episode of Understanding Semiconductors, subscribe on Apple Podcasts, Spotify, and the website.
Listening on a desktop & can’t see the links? Just search for Understanding Semiconductors in your favorite podcast player.
In this episode of Understanding Semiconductors, Markus speaks with Dr. Yihing Lin. Dr. Lin is the Vice President of the Analytical Service Group within Covalent Metrology. Covalent Metrology is a leading supplier of cutting edge analytical services and enterprise metrology solutions for diverse companies doing advanced material innovations.
This episode covers:
Dr. Lin’s Career Journey - Intel, TSMC, etc
Where Dr. Lin believes Metrology is heading and blending that into what role metrology currently plays in semiconductor development and manufacturing
How does big data play into the standards in the Semiconductor Industry?
The current and future of Metrology
Reach out to Markus for any potential guest requests or episode ideas here: https://www.linkedin.com/in/markus-kuhn-4b502110/
For the latest in new Metrology Techniques and Solutions check out https://rsmd.rigaku.com/
To make sure you never miss an episode of Understanding Semiconductors, subscribe on Apple Podcasts, Spotify, and the website.
Listening on a desktop & can’t see the links? Just search for Understanding Semiconductors in your favorite podcast player.
Dr. Diebold is back for another episode! This time, he deep dives into Lab to Fab, Near Fab artificial intelligence.
Join us as we discuss:
Examples of Lab to Fab Transitions
Machine Learning – How to Deal with Big Data
Key Takeaways from the 2022 Frontiers Conference:Machine Learning vs Regular Algorithms,
How to address the talent gap in the semiconductor industry
Reach out to Markus for any potential guest requests or episode ideas here: https://www.linkedin.com/in/markus-kuhn-4b502110/
For the latest in new Metrology Techniques and Solutions check out https://rsmd.rigaku.com/
To make sure you never miss an episode of Understanding Semiconductors, subscribe on Apple Podcasts, Spotify, and the website.
Listening on a desktop & can’t see the links? Just search for Understanding Semiconductors in your favorite podcast player.
The National Institute of Standards and Technology (NIST) is a physical sciences laboratory and non-regulatory agency of the United States Department of Commerce. NIST's activities are organized into laboratory programs that include nanoscale science and technology, engineering, information technology, neutron research, material measurement, and physical measurement.
In today’s episode Markus speaks with Alex Liddle, Scientific Director at NIST.
They discuss:
Alex’s Career Journey to NIST
Dimensional Metrology
The Measurement of a Test Structure vs. the Actual Structure and CoverageThe trend to measure everything you can across the wafer
Key Trends Alex noticed at this years Frontiers conference
Stochastic Failures, Lithography and Reliability
Reach out to Markus for any potential guest requests or episode ideas here: https://www.linkedin.com/in/markus-kuhn-4b502110/
For the latest in new Metrology Techniques and Solutions check out https://rsmd.rigaku.com/
To make sure you never miss an episode of Understanding Semiconductors, subscribe on Apple Podcasts, Spotify, and the website.
Listening on a desktop & can’t see the links? Just search for Understanding Semiconductors in your favorite podcast player.
In today’s episode, Markus speaks with Paul van der Heide, Ph.D. Paul is the Materials and Component Analysis Director at IMEC.
The conversation is primarily focused on the critical role of Labs in the Semiconductor space. Specifically:
What is IMEC?
Paul’s Career Journey to IMEC
The Critical Role of Labs in Metrology and the Semiconductor Industry
How has the role of a lab changed in the last 30 years?
Reach out to Markus for any potential guest requests or episode ideas here: https://www.linkedin.com/in/markus-kuhn-4b502110/
For the latest in new Metrology Techniques and Solutions check out https://rsmd.rigaku.com/
To make sure you never miss an episode of Understanding Semiconductors, subscribe on Apple Podcasts, Spotify, or wherever you get your podcasts.
Listening on a desktop & can’t see the links? Just search for Understanding Semiconductors in your favorite podcast player.
Our TOPPODCAST Picks 
